The Advanced Characterization Facility is a central facility of Amrita Vishwa Vidyapeetham, established in 2013, under the oversight of the Department of Chemical Engineering & Materials Science, providing materials characterization & testing services to researchers within and outside Amrita. The center was set up through grants from MHRD (under FAST grant to create the Center of Excellence in Advanced Materials & Green Technologies), institutional funding from Amrita, and other research sponsors (government and industrial).
Fourier Transform Infrared Spectrometer (FTIR)
Make: Themofisher, Model: Nicolet is10
The infrared spectrum originates from the vibrational motion of the molecule. The interference pattern obtained from a two beam interferometer as the path difference between the two beams is altered, when Fourier transformed, gives rise to the spectrum. The transformation of the interferogram into spectrum is carried out mathematically with a dedicated on-line computer. Infrared spectrum is useful in identifying the functional groups like -OH, -CN, -CO, -CH, -NH2, etc.
Essential Specification:
UV Spectrophotometer
Make: Shimatzu, Model:UV-1800
The UV-spectrum is due to the electronic transitions and vibrational modes of the molecule. The absorption (A) of a solution at a particular wavelength is given by Beer-Lambert's law A=ect where c is the concentration of the compound, t is the thickness of the cell and e is the molar extinction coefficient characteristic of the compound at a given wavelength. This principle is used for quantitative measurements.
Essential Specification :
Gas Chromatography Mass Spectrometry (GC-MS)
Make: Shimatzu, Model:Ultra Q20
In general the analytical GCMS is used to obtain information for the identification, quantification, and resolution of a compound synthesized. GCMS systems are currently used in a wide variety of fields like food & beverages, pharmaceuticals, agriculture, environmental and etc.
Essential Specification :
Thermo Gravimetric Analysis (TGA)
Make: TA Instruments, Model: STD Q600
Thermal studies are used to study the thermal properties of the materials as a function of temperature, while the materials are subjected to a controlled temperature and atmospheric condition. TGA studies are includes, Thermogravimetry analyses (TGA) - change in weight and Differential Thermal Analysis (DTA) -temperature difference. This technique widely used for polymers, organic, inorganic, metals, alloys, glass, and ceramics materials. Essential Specification : Simultaneous TG-DTA measurements Temperature range : RT to 1100°C Purge gas : Nitrogen, Pan: Alumina
Differential Thermal Analysis (DSC)
Make: TA Instruments, Model: Q20
This is another thermal studies are used to study the thermal properties of the materials. Here, heat flow measured as a function of temperature, while the materials are subjected to a controlled temperature and atmospheric condition. This technique widely used for polymers, organic, inorganic, metals, alloys, glass, and ceramics materials.
Essential Specification & Features:
X-Ray Diffraction (X-RD)
Make: Rigaku, Model: Ultima IV
X-ray diffraction analysis is a fast, non-destructive and environmentally friendly analysis method with very high accuracy and reproducibility. X-ray diffraction facility offers high quality diffraction data for both powder and thin film specimens including Inorganic materials, ceramics, metals, intermetallic, minerals, and composites.
This facility focus on :
Essential Specification :
Field Emission – Scanning Electron Microscopy (FE-SEM)
Make: Carlzeiss, Model: Gemini 300
Field Emission Scanning Electron Microscope (FE-SEM) provides ultra-high resolution imaging at low accelerating voltages and small working distances. The Geminis SEM 300 provides resolution of the images is as low as 2 nm at 15 kV, allowing examination of the top surface of nano-powders, nano-film and nanofiber in the wide range of applications such as mineralogy, ceramics, polymer, metallurgy, electronic devices, chemistry, physics and life sciences.
Essential Specification & Features :
Detectors :
S. No. | Testing & Characterization Facility | For Other Educational Institutes | For Govt. R&D Labs | For Industries |
---|---|---|---|---|
1 | FTIR [KBr & ATR mode] | 200 | 200 | 500 |
2 | UV | 200 | 400 | 800 |
3 | DSC – Only heating | 500 | 500 | 1000 |
*Heating + Cooling | *750 | *750 | *1500 | |
4 | TGA –upto 700 °C | 500 | 500 | 1000 |
*Above 700 °C | *750 | *750 | *1500 | |
5 | GC-MS | 1000 | 1000 | 2500 |
*GC- FID or TCD *MS- DI mode |
*500 | *500 | *1500 | |
6 |
XRD – Powder Normal scan |
400 | 400 | 1500 |
XRD – Powder *Slow scan (below 2 D) |
*600 | *600 | *2000 | |
Thin Films Normal scan |
400 | 400 | 1500 | |
Thin Films *Slow scan (below 2 D) |
*600 | *600 | *2000 | |
7 |
FE-SEM | 1200 | 2000 | 4000 |
EDAX+Colour Mapping | 400 | 1000 | 2000 | |
Gold coating for non conducting materials | 200 | 400 | 800 |
R. Senthilkumar,
Technical Manager - CoE AMGT
Mobile : 9585534354