About Center of Advanced Characterization Facilities

The Advanced Characterization Facility is a central facility of Amrita Vishwa Vidyapeetham, established in 2013, under the oversight of the Department of Chemical Engineering & Materials Science, providing materials characterization & testing services to researchers within and outside Amrita. The center was set up through grants from MHRD (under FAST grant to create the Center of Excellence in Advanced Materials & Green Technologies), institutional funding from Amrita, and other research sponsors (government and industrial).


People

Dr. Sriram Devanathan
Chairperson, Department of Chemical Engineering & Materials Science
Head - Center of Excellence in Advanced Materials & Green Technologies
Mr. R. Senthilkumar
In-Charge & Technical Manager


 




Fourier Transform Infrared Spectrometer (FTIR)
Make: Themofisher, Model: Nicolet is10

The infrared spectrum originates from the vibrational motion of the molecule. The interference pattern obtained from a two beam interferometer as the path difference between the two beams is altered, when Fourier transformed, gives rise to the spectrum. The transformation of the interferogram into spectrum is carried out mathematically with a dedicated on-line computer. Infrared spectrum is useful in identifying the functional groups like -OH, -CN, -CO, -CH, -NH2, etc.

Essential Specification:

  • Wave number range : 4000 to 400 cm -1.
  • Resolution : 0.4 cm -1. DTGS detector, IR library
  • Mode : KBr mode and ATR mode
  • Samples required : 10 mg Powder, Thin Film (5mm min), Solid (thickness less than 5mm)

UV Spectrophotometer
Make: Shimatzu, Model:UV-1800

The UV-spectrum is due to the electronic transitions and vibrational modes of the molecule. The absorption (A) of a solution at a particular wavelength is given by Beer-Lambert's law A=ect where c is the concentration of the compound, t is the thickness of the cell and e is the molar extinction coefficient characteristic of the compound at a given wavelength. This principle is used for quantitative measurements.

Essential Specification :

  • Wave length Range : 170 nm to 1100nm
  • Resolution : 0.1 nm.
  • Samples required : 20 mg.
  • Solvent must be specified for solution studies.






Gas Chromatography Mass Spectrometry (GC-MS)
Make: Shimatzu, Model:Ultra Q20

In general the analytical GCMS is used to obtain information for the identification, quantification, and resolution of a compound synthesized. GCMS systems are currently used in a wide variety of fields like food & beverages, pharmaceuticals, agriculture, environmental and etc.

Essential Specification :

  • Sample Injector : Auto injector & manual injector for liquid samples and gas samples. For solid samples, direct injection mode available (DI).
  • Composition accuracy : +/- 0.5%
  • Detectors : FID, TCD and MS.

Thermo Gravimetric Analysis (TGA)
Make: TA Instruments, Model: STD Q600

Thermal studies are used to study the thermal properties of the materials as a function of temperature, while the materials are subjected to a controlled temperature and atmospheric condition. TGA studies are includes, Thermogravimetry analyses (TGA) - change in weight and Differential Thermal Analysis (DTA) -temperature difference. This technique widely used for polymers, organic, inorganic, metals, alloys, glass, and ceramics materials. Essential Specification : Simultaneous TG-DTA measurements Temperature range : RT to 1100°C Purge gas : Nitrogen, Pan: Alumina







Differential Thermal Analysis (DSC)
Make: TA Instruments, Model: Q20

This is another thermal studies are used to study the thermal properties of the materials. Here, heat flow measured as a function of temperature, while the materials are subjected to a controlled temperature and atmospheric condition. This technique widely used for polymers, organic, inorganic, metals, alloys, glass, and ceramics materials.

Essential Specification & Features:

  • Temperature range: -80°C to 400°C,
  • Maximum rate of heating 30°C/min
  • Purge gas: Nitrogen, Pan: Aluminium
  • Capable for measurements including Glass transition temperature, Melting point, Specific heat measurement, Degree of crystallinity and Reaction kinetics.

X-Ray Diffraction (X-RD)
Make: Rigaku, Model: Ultima IV

X-ray diffraction analysis is a fast, non-destructive and environmentally friendly analysis method with very high accuracy and reproducibility. X-ray diffraction facility offers high quality diffraction data for both powder and thin film specimens including Inorganic materials, ceramics, metals, intermetallic, minerals, and composites.

This facility focus on :

  • Phase identification
  • Purity/quality control of materials
  • Determination of crystallinity
  • Lattice parameter determination
  • Gracing Incidence

Essential Specification :

  • Max power: 3KW, Target – Cu, Minimum step size – 0.001˚
  • Detector: Scintillation counter, Goniometer max range: upto 120 ˚
  • Attachment: STD, Thin-film, SAXS (powder & liquid






Field Emission – Scanning Electron Microscopy (FE-SEM)
Make: Carlzeiss, Model: Gemini 300

Field Emission Scanning Electron Microscope (FE-SEM) provides ultra-high resolution imaging at low accelerating voltages and small working distances. The Geminis SEM 300 provides resolution of the images is as low as 2 nm at 15 kV, allowing examination of the top surface of nano-powders, nano-film and nanofiber in the wide range of applications such as mineralogy, ceramics, polymer, metallurgy, electronic devices, chemistry, physics and life sciences.

Essential Specification & Features :

  • Maximum acceleration voltage: 30kV
  • Apertures range: 10 to 300 micron
  • Magnification range: 20x to 300000x
  • Specimen height: 30mm at 10 mm W.D
  • Gold coating for non conducting materials (4-7 nm thick)
  • Colour elemental mapping

Detectors :

  • InLens & ESB detector (topographic information)
  • BSD4 and SE2 detector (materials composition contrast)
  • Energy dispersive x-ray spectroscopy (EDS) coupled with FE-SEM is used to determine the chemical composition of micro-features including Boron (B) to Uranium (U).

Charges for Characterization

S. No. Testing & Characterization Facility For Other Educational Institutes For Govt. R&D Labs For Industries
1 FTIR [KBr & ATR mode] 200 200 500
2 UV 200 400 800
3 DSC – Only heating 500 500 1000
*Heating + Cooling  *750 *750 *1500
4 TGA –upto 700 °C  500 500 1000
*Above 700 °C  *750 *750 *1500
5 GC-MS 1000 1000 2500
*GC- FID or TCD
*MS- DI mode
*500 *500 *1500

6
XRD – Powder 
Normal scan
400 400 1500
XRD – Powder 
*Slow scan (below 2 D)
*600 *600 *2000
Thin Films
Normal scan
400 400 1500
Thin Films
*Slow scan (below 2 D)
*600 *600 *2000

7
FE-SEM 1200 2000 4000
EDAX+Colour Mapping 400 1000 2000
Gold coating for non conducting materials 200 400 800


For Further Details Contact:

R. Senthilkumar,
Technical Manager - CoE AMGT
Mobile : 9585534354