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An analysis of microwave surface resistance of high Tc thin film based on modified two fluid model is presented. It incorporates the structural anomalies due to grains and grain boundaries in the material. The experimental surface resistance values of the films, having different structural morphology are fitting well with this theory.
M. Misra, Kataria, N. D., Dr. Jayakumar M., and Gupta, A. K., “Analysis of microwave surface resistance of YBCO thin films by structural dependent two fluid model”, in Advances in superconductivity: new materials, critical currents and devices, Condensed Matter Physics, Superconductivity And Superfluidity (G6411) , 1997, pp. 230-234.