Publication Type:

Conference Paper

Source:

Proceedings of the IEEE International Conference on VLSI Design, IEEE Computer Society, Volume 2016-March, p.559-560 (2016)

ISBN:

9781467387002

URL:

https://www.scopus.com/inward/record.uri?eid=2-s2.0-84964683439&partnerID=40&md5=2d56a5c6ac3ef552aa6c9047308d82e0

Keywords:

Circuit-level simulation, Current steering DAC, Current steering digital-to-analog converters, Digital to analog conversion, Embedded systems, Hardening, Heat radiation, Performance degradation, Radiation, Radiation hardening, Radiation-hardened, Signal to noise ratio, Vt extractor

Abstract:

<p>This paper studies the effect of radiation on the performance of a 12-bit current steering digital-to-analog converter (DAC) and proposes a digitally assisted radiation hardening technique to overcome the performance degradation due to radiation. Circuit level simulations in UMC 65-nm SP process show that Signal-to-Noise Ratio (SNR) of the DAC falls from 74 dB to 41. 29 dB with radiation dose ranging from 0 to 100 Mrad and the proposed hardening technique overcomes this performance degradation. © 2016 IEEE.</p>

Notes:

cited By 0; Conference of 29th International Conference on VLSI Design, VLSID 2016 ; Conference Date: 4 January 2016 Through 8 January 2016; Conference Code:120013

Cite this Research Publication

A. T. Kunnath and Sahoo, B. Datta, “A Digitally Assisted Radiation Hardened Current Steering DAC”, in Proceedings of the IEEE International Conference on VLSI Design, 2016, vol. 2016-March, pp. 559-560.

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