Publication Type:

Conference Paper

Source:

2012 IEEE 10th International New Circuits and Systems Conference, NEWCAS 2012, Montreal, QC, p.249-252 (2012)

ISBN:

9781467308595

URL:

http://www.scopus.com/inward/record.url?eid=2-s2.0-84868270778&partnerID=40&md5=d4021397fc07c34ffa9ceb6dd2f9f841

Keywords:

CMOS integrated circuits, CMOS technology, Double sampling, Error feedback, First order, High-gain, Nanometer CMOS, Noise-shaping, Op amps, Output swing, Reference buffers, Sample rate, Topology

Abstract:

<p>A first order error feedback based noise shaping in a double sampled ADC is proposed. This topology is ideal for nanometer CMOS technology, as it obviates the need for high-gain and high output-swing op amps and fast-settling, power-hungry, and noisy reference buffers. Using a one stage op amp with a gain of 70 (i.e. 37 dB) and output swing of ±75 mV , this topology, realized in GPDK 90-nm CMOS technology, achieves an SNDR of 60 dB operating at 1 GHz (effective sample rate of 2 GHz due to double sampling) with an OSR of 32. © 2012 IEEE.</p>

Notes:

cited By (since 1996)0; Conference of org.apache.xalan.xsltc.dom.DOMAdapter@6d1f3328 ; Conference Date: org.apache.xalan.xsltc.dom.DOMAdapter@1b57bf10 Through org.apache.xalan.xsltc.dom.DOMAdapter@1dc0c176; Conference Code:93621

Cite this Research Publication

V. Sarma and Sahoo, B., “Error feedback based noise shaping in a double sampled ADC”, in 2012 IEEE 10th International New Circuits and Systems Conference, NEWCAS 2012, Montreal, QC, 2012, pp. 249-252.

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