Publication Type:

Conference Paper

Source:

Materials Today: Proceedings, Elsevier Ltd, Volume 4, Number 8, p.9237-9245 (2017)

URL:

https://www.scopus.com/inward/record.uri?eid=2-s2.0-85032305651&doi=10.1016%2fj.matpr.2017.07.283&partnerID=40&md5=ce391b23562229eb10caced4c3845cf7

Abstract:

<p>In the present work ZnO doped with Al2O3 (2, 4, 6, 8 and 10 wt%) is prepared by conventional solid state reaction method. X-ray diffraction results revealed that the sample was crystalline with a hexagonal wurtzite phase. The X-ray diffraction peaks intensity is sharp and narrow, confirming that the sample is of high quality with good crystallinity and fine grain size. As the concentration of alumina (Al2O3) increases in ZnO, the peak (0 0 2) shifted towards higher angle and there was decrease in intensity with increase in alumina concentration. This shifting in peak position and decrease in intensity reflect that Al is successfully replaced Zn in ZnO matrix as diffraction of X-ray changes. X-ray peak broadening analysis was used to evaluate the crystallite size and lattice strain by the Williamson-Hall (W-H) method. All other relevant physical parameters such as strain, stress, and energy density values were also calculated using W-H method with different models namely uniform deformation model (UDM), uniform stress deformation model (USDM) and uniform deformation energy density model (UDEDM). © 2017 Elsevier Ltd.</p>

Notes:

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Cite this Research Publication

V. M. Chittan, C. Kumar, M., Sowjanya, K., and B. Kumar, R., “Estimation of Lattice Strain in Nanometer-sized Alumina Doped ZnO Ceramics by X-ray Peak Profile Analysis”, in Materials Today: Proceedings, 2017, vol. 4, pp. 9237-9245.

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