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External defect analysis using image processing in Labview

Publication Type : Conference Proceedings

Source :  International Journal of Engineering Research & Technology (IJERT)-NCARMS

Campus : Coimbatore

School : School of Engineering

Year : 2016

Abstract :

Cite this Research Publication : Shuprajhaa T., Subasree S., Vaitheeshwari M.,Sivakumar S, External defect analysis using image processing in Labview,  International Journal of Engineering Research & Technology (IJERT)-NCARMS, 2016.

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