<p>A hybrid test data compression method is presented which is targeted at minimizing the volume of test data, which reduces memory requirements for test data and also time required to test the entire data. The compression scheme is so called hybrid as it combines a transform along with the encoding scheme. In the proposed approach, encoding schemes such as Frequency Directed Run length encoding and Shannon Fano encoding schemes are applied on the transformed data. The proposed scheme is applied on ISCAS'85, ISCAS'89 and ITC'99 benchmark circuits and compared in terms of their compression ratio. © 2016 IEEE.</p>
cited By 0; Conference of 2016 International Conference on Advanced Communication Control and Computing Technologies, ICACCCT 2016 ; Conference Date: 25 May 2016 Through 27 May 2016; Conference Code:126081
A. Asokan and Dr. Anita J. P., “Multistage test data compression technique for VLSI circuits”, in Proceedings of 2016 International Conference on Advanced Communication Control and Computing Technologies, ICACCCT 2016, 2016, pp. 65-68.