Publication Type:

Conference Paper

Source:

Proceedings of 2011 International Conference on Process Automation, Control and Computing, PACC 2011, Coimbatore (2011)

ISBN:

9781612847641

URL:

http://www.scopus.com/inward/record.url?eid=2-s2.0-80052216489&partnerID=40&md5=5cf716772fdd4cfa5504e0c26a73eb56

Keywords:

Back tracing, Bridging fault, Critical path tracing, CUD, Delay circuits, Delay faults, Digital circuits, Integrated circuit manufacture, Integrated circuit testing, Process control, Stuck-open faults, VLSI circuits

Abstract:

With the advent of VLSI, very complex circuits can be implemented in a single chip. So the need for testing the chip increases with the integration. Fault diagnosis results in improving the circuit design process, the manufacturing yield, cost of testing and also reduces the time to market. Diagnosis of today's complex faults is a challenging problem due to the explosion of the underlying solution space with the increasing number of fault locations. This paper gives a comprehensive framework for logic diagnosis of multiple arbitrary faults that can occur in combinational digital circuits. This approach employs the effect cause analysis for the fault diagnosis. To demonstrate the applicability of the proposed method stuck at faults ,bridging faults, open-interconnect fault, stuck open faults, delay faults and a combination of these faults in the same circuit simultaneously leading to multiple faults are dealt with. © 2011 IEEE.

Notes:

cited By (since 1996)0; Conference of org.apache.xalan.xsltc.dom.DOMAdapter@1bbd5831 ; Conference Date: org.apache.xalan.xsltc.dom.DOMAdapter@2be90731 Through org.apache.xalan.xsltc.dom.DOMAdapter@4fd7387c; Conference Code:86336

Cite this Research Publication

R. Raju, Anita, J. P., and Vanathi, P. T., “Novel approach for multiple arbitrary faults diagnosis in combinational circuits”, in Proceedings of 2011 International Conference on Process Automation, Control and Computing, PACC 2011, Coimbatore, 2011.