Publication Type:

Patent

Source:

Amrita Vishwa Vidyapeetham, Volume US20170132453 A1, Number US 15/373,850, India (2017)

URL:

https://www.google.com/patents/US9805251

Abstract:

Systems and methods of automatic detection of a facial feature are disclosed. Moreover, methods and systems of yaw estimation of a human head based on a geometrical model are also disclosed.

Cite this Research Publication

Dr. Athinarayanan S. and Bijlani, K., “Systems and Methods for Yaw Estimation”, U.S. Patent US 15/373,8502017.

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