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Course Detail

Course Name Electronic Circuits I
Course Code 19EAC201
Program B. Tech. in Electronics and Computer Engineering
Semester 3
Year Taught 2019


Module I

Diode Fundamentals: Diode characteristics – Physics of diode operation and modeling of diodes. Diode applications: Rectifiers – Clipper and clamper circuits – Voltage multipliers – Voltage regulator using zener diode.

Module II

Field effect transistors: Introduction – Device structure and operation of JFET (Junction Field Effect Transistor) and MOSFETs – I-V characteristics of JFET and MOSFET – MOSFET applications – brief Analysis of MOS as a switch and as an amplifier, biasing, small signal analysis.

Module III

Single stage MOS amplifiers (CS, CD, CG), MOS capacitances – Low frequency and Miller effect – MOS high frequency model and amplifier frequency analysis, cut off frequency fα and fβ unity gain and Determination of bandwidth of single stage – MOSFET current sources, introduction current mirrors.

Module IV

Bipolar junction transistors: Introduction – Operation of BJT- I-V characteristics of BJT. BJT Applications: BJT biasing techniques – Analysis of BJT as a switch and as an amplifier (CE amplifier) – Small signal analysis.

Objectives and Outcomes

Course Objectives

  • To understand operation of semiconductor devices
  • To understand DC analysis and AC models of MOSFET and BJT.
  • To use MOSFET and BJT as switches and amplifiers

Course Outcomes

  • CO1: Ability to understand diode characteristics and to design diode based circuits.
  • CO2: Ability to understand the operation of MOSFET.
  • CO3: Ability to design MOSFET based circuits.
  • CO4: Ability to understand BJT.
  • CO5: Ability to design and analyze BJT based circuits.

CO – PO Mapping

PO1 PO2 PO3 PO4 PO5 PO6 PO7 PO8 PO9 PO10 PO11 PO12 PSO1 PSO2
CO1 3 3 2 2
CO2 3 3 3 2 2
CO3 3 3 2 2
CO4 3 3 2 2
CO5 3 3 2 2

Textbook / References

Textbook / Reference

  • Sedra A and Smith K C, “Microelectronic circuits”, Sixth Edition, Oxford University Press, 2010.
  • Neamen D A, “Electronic circuit analysis and design”, McGraw Hill, 2001.
  • Boylestad R L and Nashelsky L, “Electronic devices and circuit theory”, Upper Saddle River N.J., Pearson/Prentice Hall, Tenth Edition, 2009.
  • Millman J and C Halkias, “Integrated electronics”, second edition, McGraw –Hill, 2010

Evaluation Pattern 50:50 (Internal: External)

Assessment Internal External
Periodical 1 (P1) 15
Periodical 2 (P2) 15
*Continuous Assessment (CA) 20
End Semester 50
*CA – Can be Quizzes, Assignment, Projects, and Reports.

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