Background on VLSI testing – Test generation - Structured DFT techniques overview
– Scan design - Boundary scan method – BIST schemes - Hardware trojan –
Trojan taxonomy - Case study - Trojan detection – Classification of trojan detection
- Challenges in trojan detection
Design for hardware trust – Delay based methods – Shadow registers – Ring
oscillators - Dummy scan Flip-Flop insertion - Trojan activation time analysis -
Layout-aware scan cell reordering - Trojan detection and isolation flow.
Security and testing – Scan-based testing – Scan-based attacks and counter
measures - System-on-chip test infrastructure - Emerging areas of test security.
Trojan prevention: Built-in self authentication - BISA structure and insertion flow -
Analyzing BISA structure - Trusted design in FPGAs.