'Material Characterization and Spectroscopic Methods' is an elective course offered in the B. Tech. in Chemical Engineering program at School of Engineering, Amrita Vishwa Vidyapeetham, Coimbatore.
Unit 1
Imaging microscopies and Image analysis: Optical Microscopy, Scanning electron microscopy, Scanning probe microscopy, X-ray microscopy and Transmission electron microscopy, Image analysis.
Unit 2
X-ray-diffraction, properties of x-rays, review of crystal systems and miller indices, stereographic projections, Laue conditions, braggs conditions, diffraction methods, phase identifications, electron diffraction methods.
Unit 3
EDAX, XPS, scattering methods, Thermal and Thermomechanical analysis: differential scanning calorimetry and Differential thermal analysis. Thermogravimetric analysis, Dynamic mechanical analysis and TMA.
- Yang Leng, Materials Characterization: Introduction to Microscopic and Spectroscopic Methods 2013, Wiley VCH; ISBN-10: 3527334637, ISBN-13: 978-3527334636.
- B. D. Cullity and S R Stock, Elements of X-ray diffraction, 3rd Ed., Prentice Hall 2001
- K P. Menard Dynamic mechanical analysis: A practical introduction, CRC press, 1999
