'Principles of VLSI Testing' is an elective course offered for the B. Tech. (Bachelor of Technology) in Electronics and Communication Engineering at School of Engineering, Amrita Vishwa Vidyapeetham.
Unit 1
Introduction - Need for testing - Role of testing - Elementary testing concepts - Fault and fault model – Defects - Errors and faults - Glossary of fault models - Single stuck-at fault - Fault equivalence - Equivalence of single stuck-at faults - Fault collapsing - Fault dominance - Checkpoint theorem.
Unit 2
Logic and fault simulation - Modeling circuits for simulation - Algorithms for true value simulation and fault simulation - Binary Decision Diagrams - Introduction and construction - Reduction rules and algorithms - ROBDDs - Operation on BDDs and its algorithms - Representation of digital circuits.
Unit 3
Combinational circuit test generation - Algebraic algorithms - Boolean difference method - Fault-table method – Path sensitizing method - ENF method - Structural algorithms - D-Algorithm - PODEM – Advanced algorithms - Fault detection - Two level circuit fault detection - Multilevel circuit fault detection. Sequential circuit test generation: Time frame expansion.
TEXTBOOKS
- Vishwani D. Agrawal and Michael L. Bushnell, “Essentials of Electronic Testing for Digital Memory and Mixed Signal VLSI Circuit,” Springer, 2000.
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REFERENCES
- Samuel. C.Lee, “Digital Circuits and Logic Design,” Prentice Hall India Ltd., 2000.
- Parag K. Lala, “An Introduction to Logic Circuit Testing,” Morgan Claypool Publishers, 2009.
- Parag K. Lala, “Digital Circuit Testing and Testability,” Academic Press, 1997.
