Introduction - Need for testing - Role of testing - Elementary testing concepts -
Fault and fault model – Defects - Errors and faults - Glossary of fault models -
Single stuck-at fault - Fault equivalence - Equivalence of single stuck-at faults -
Fault collapsing - Fault dominance - Checkpoint theorem.
Logic and fault simulation - Modeling circuits for simulation - Algorithms for true
value simulation and fault simulation - Binary Decision Diagrams - Introduction and
construction - Reduction rules and algorithms - ROBDDs - Operation on BDDs and
its algorithms - Representation of digital circuits.
Combinational circuit test generation - Algebraic algorithms - Boolean difference
method - Fault-table method – Path sensitizing method - ENF method - Structural
algorithms - D-Algorithm - PODEM – Advanced algorithms - Fault detection - Two
level circuit fault detection - Multilevel circuit fault detection. Sequential circuit test
generation: Time frame expansion.