COURSE SUMMARY
Course Title: 
Principles of VLSI Testing
Course Code: 
15ECE369
Year Taught: 
2014
Type: 
Elective
Degree: 
Undergraduate (UG)
School: 
School of Engineering
Campus: 
Bengaluru
Chennai
Coimbatore
Amritapuri

'Principles of VLSI Testing' is an elective course offered for the B. Tech. (Bachelor of Technology) in Electronics and Communication Engineering at School of Engineering, Amrita Vishwa Vidyapeetham.

Unit 1

Introduction - Need for testing - Role of testing - Elementary testing concepts - Fault and fault model – Defects - Errors and faults - Glossary of fault models - Single stuck-at fault - Fault equivalence - Equivalence of single stuck-at faults - Fault collapsing - Fault dominance - Checkpoint theorem.

Unit 2

Logic and fault simulation - Modeling circuits for simulation - Algorithms for true value simulation and fault simulation - Binary Decision Diagrams - Introduction and construction - Reduction rules and algorithms - ROBDDs - Operation on BDDs and its algorithms - Representation of digital circuits.

Unit 3

Combinational circuit test generation - Algebraic algorithms - Boolean difference method - Fault-table method – Path sensitizing method - ENF method - Structural algorithms - D-Algorithm - PODEM – Advanced algorithms - Fault detection - Two level circuit fault detection - Multilevel circuit fault detection. Sequential circuit test generation: Time frame expansion.

TEXTBOOKS

  1. Vishwani D. Agrawal and Michael L. Bushnell, “Essentials of Electronic Testing for Digital Memory and Mixed Signal VLSI Circuit,” Springer, 2000.
  2. .

REFERENCES

  1. Samuel. C.Lee, “Digital Circuits and Logic Design,” Prentice Hall India Ltd., 2000.
  2. Parag K. Lala, “An Introduction to Logic Circuit Testing,” Morgan Claypool Publishers, 2009.
  3. Parag K. Lala, “Digital Circuit Testing and Testability,” Academic Press, 1997.