Publication Type:

Conference Paper

Source:

AIP Conference Proceedings, American Institute of Physics Inc., Volume 1728 (2016)

ISBN:

9780735413757

URL:

https://www.scopus.com/inward/record.uri?eid=2-s2.0-84984548428&partnerID=40&md5=c5b3a236e2acab69a0a73b472b847b22

Abstract:

In order to explore the structural modification induced electrical conductivity, samples of Bakelite Resistive Plate Chamber (RPC) detector materials were exposed to 100 keV Oxygen ion in the fluences of 1012, 1013, 1014 and 1015 ions/cm2. Ion implantation induced microstructural changes have been studied using Positron Annihilation Lifetime Spectroscopy (PALS) and X-Ray Diffraction (XRD) techniques. Positron lifetime parameters viz., o-Ps lifetime and its intensity shows the deposition of high energy interior track and chain scission leads to the formation of radicals, secondary ions and electrons at lower ion implantation fluences (1012 to1014 ions/cm2) followed by cross-linking at 1015 ions/cm2 fluence due to the radical reactions. The reduction in electrical conductivity of Bakelite detector material is correlated to the conducting pathways and cross-links in the polymer matrix. The appropriate implantation energy and fluence of Oxygen ion on polymer based Bakelite RPC detector material may reduce the leakage current, improves the efficiency, time resolution and thereby rectify the aging crisis of the RPC detectors. © 2016 Author(s).

Notes:

cited By 0; Conference of International Conference on Condensed Matter and Applied Physics, ICC 2015 ; Conference Date: 30 October 2015 Through 31 October 2015; Conference Code:121744

Cite this Research Publication

K. VaAneesh Kumar, Ranganathaiah, Cb, Kumaraswamy, G. N., and Ravikumar, H. Ba, “Oxygen ion implantation induced microstructural changes and electrical conductivity in Bakelite RPC detector material”, in AIP Conference Proceedings, 2016, vol. 1728.

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