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Publication Type : Journal Article
Publisher : IOP Publishing Ltd.
Source : Material Research Express, Vol. 6, (2019), No.6.065038. DOI 10.1088/2053-1591/ab0a4c
Keywords : Conductive films, Dielectric Properties, Dielectric response, Equivalent electrical circuits, Grain boundaries, High dielectric constants, Maxwell-Wagner polarization, Nanoparticles, Structure dependent, Tetragonal zirconia, Thin films, Zirconia, zirconia nanoparticles, ZrO2
Campus : Coimbatore, Kochi
School : School of Physical Sciences, School of Arts and Sciences, School of Engineering
Department : Sciences
Year : 2019
Abstract : In this work the structural dependent dielectric property of ZrO 2 nanoparticles and films prepared using these nanoparticles is studied. The tetragonal and monoclinic dominant zirconia nanoparticles were obtained through thermal treatment of PVP/CTAB capped hydrous amorphous zirconia (HAZ) at 500 °C. The grain (R g ) and grain boundary (R gb ) resistances of both types of nanoparticles along with films are estimated by fitting the respective complex impedance (Nyquist) plots with an equivalent electrical circuit. The nanostructured tetragonal dominant zirconia films are highly conductive as compared to monoclinic films due to large amount of Zr 3+ ions present at tetragonal sites. Consequently the film exhibits a high dielectric constant at lower frequency range due to Maxwell-Wagner polarization. Moreover the EPR signals observed at 1.946 (g || ) and 1.967 (g) reveals the presence of greater Zr 3+ ions tetragonal films. The R gb of monoclinic dominant film is increased by an order of 10 3 and consequently results in significant reduction of dielectric constant. Further the shift of loss tangent peak to higher frequency side of tetragonal dominant films endorses the higher mobility of charge carriers as that of monoclinic films. The enhancement of dielectric properties shows the potential application of tetragonal dominant ZrO 2 films for future electronic devices. © 2019 IOP Publishing Ltd.
Cite this Research Publication : Sreedevi R Mohan, Uma Maheswari A., and M. Sivakumar, "Structure dependent dielectric response of spray coated nanostructured zirconia thin films," Material Research Express, Vol. 6, (2019), No.6.065038. DOI 10.1088/2053-1591/ab0a4c