Back close

Design And Analysis of Analog TRNG Using Sample and Hold Circuit

Publication Type : Journal Article

Publisher : International Journal of Engineering & Technology.

Source : International Journal of Engineering & Technology, Volume 7, Number 3.8, p.69–73 doi = 10.14419/ijet.v7i3.8.15222 (2018)

Url :

Keywords : Hardware security, NIST Tests, Random noise, Sample and hold, TRNG.

Campus : Coimbatore

School : School of Engineering

Department : Electronics and Communication

Year : 2018

Abstract : Implementation of analog True random number generators is inevitable in almost all the security applications and encryption protocols nowadays. Although many digital True Random Number Generators are available, we proposed a method of random number generation using analog module of mixed signals. In actual fact generation of True Random Numbers is by utilizing the sample and hold circuit which is controlled by another random clock source, and a post processing circuit for generation of unpredictable binary sequence of numbers. The primary input source is an analog signal, essentially highly random noise from the external environment. The high unpredictability, less resource and simple circuit design are some highlights of the proposed work. Finally, the randomness is evaluated using NIST test suites and results are plotted and analyzed.

Cite this Research Publication : B. Aksshaya, G V., M. L., S, N., T, V., and N Mohankumar, “Design And Analysis of Analog TRNG Using Sample and Hold Circuit”, International Journal of Engineering & Technology, vol. 7, pp. 69–73 doi = 10.14419/ijet.v7i3.8.15222, 2018.

Admissions Apply Now