Publication

Abstract : This study presents a novel approach which enhances the data retention capability of PMOS gain cell based embedded DRAM. The proposed circuit technique utilizes a parasitic capacitance between the cell storage node and the common n‐well body. During the write operation, an up‐down voltage transition to the n‐well increases the cell storage retention time without using any optional devices. It also results in much high immunity against the write “1” disturbance. Measured and simulated results from an 8192‐wordx8‐bit eDRAM macro implemented in a 0.13‐μm generic CMOS process exhibit 58% increased retention time and approximately 3.6 times stronger write disturbance immunity over the conventional design.