Course

UNIT 1:Error and data analysis: Review of error analysis estimate confidence intervals statistical inferences linear and nonlinear regression analysis including analysis (?2 test), correlation analysis (R2)UNIT 2:Review of Fourier Transforms: Time domain and frequency domain spectra, Implementing Fast Fourier Transforms.UNIT 3:X-ray diffraction and detectors Production of X-rays, Scattering from an electron, atom and unit cell (calculation of structure factors), Powder X-ray diffraction and determination of crystal structures from diffraction data, particle and photon detectors: GM counter, Scintillation detector, Proportional counterUNIT 4:Microscopy: Scanning electron microscopy and transmission electron microscopy Discussion of electron sources, Secondary and Backscattered electrons, analytical electron microscopy, electron diffraction, amplitude and phase contrast microscopy.UNIT 5:Spectroscopy: Review of IR, EPR and NMR spectral lines including selection rules, calculation of g-factor, instrumentation for IR, EPR, and NMR

Course Objectives:This course explores error analysis, Fourier transforms, X-ray diffraction techniques, and various detection methods. It also covers microscopy techniques such as SEM and TEM, along with spectroscopy principles, including IR, EPR, and NMR, emphasizing instrumentation and data analysis.Course Outcomes:On completion of the course, students will be able to:CO1: Apply error analysis and quantification of error propagation in linear/non-linear systemsCO2: Understand and apply Fourier transforms and their relevance in extracting signals from the time domain and displaying in the frequency domainCO3: Understand the principles of diffraction and various types of spectroscopy techniques.CO4. Interpret 1D X-ray diffraction data, understand imaging modes in microscopes, and interpretation of signals from various spectroscopic instruments.

TEXT/REFERENCE BOOKS:1.Bevington and Robinson, Data Reduction and Error Analysis for the physical sciences, 3rd Ed., McGraw-Hill Education, 2002.2.John. R Taylor, An introduction to error analysis: The study of uncertainties in physical measurements, 2nd Ed., University Science Books, 1997. 3.Erwin Kreyszig, Advanced Engineering Mathematics, 10th Ed., Wiley, 2015.4.J. F James, A students guide to Fourier Transforms, 3rd Ed., Cambridge University Press, 2012.5.S S Kapoor and V S Ramamoorthy, Nuclear Radiation detectors, New Age International, 1993.6.Ramakanth Hebbar, Basics of X-ray diffraction and its applications, 1st Ed., I. K. International Publishing House, 2011.7.B E Warren, X-ray diffraction, New edition Ed., Dover Publications Inc. 1990.8.Ray F Egerton, Physical Principles of Electron Microscopy: An introduction to SEM, TEM and AEM, Springer, 2005.9.Colin Banwell, Elaine Mccash, Fundamentals of Molecular spectroscopy, McGraw Hill Education, 4th Ed., 1994.