- For the given bias current, obtain the output and transfer characteristics of a typical 90 nm NMOS device. Determine the effect of varying (i) Drain voltage, (ii) Gate voltage, (iii) Body bias voltage and (iv) Aspect ratio. Repeat for PMOS device
- Experimentally determine transconductance gain, threshold voltage, overdrive voltage, Early voltage, small signal input-output resistance and voltage gain of the given device for the specified bias point. Based on this, determine (i) Large-signal equivalent, (ii) Small signal equivalent, (iii) High frequency equivalent of the device and (iv)Transit frequency.
- Construct a common-source amplifier with resistive load by setting the bias point mentioned in Expt. No.1. Based on this, (i) Observe its dc simulation, ac simulation and transient analysis, (ii) Determine the mid-band gain, 3-dB frequency, Gain-bandwidth product, and phase angle from the relevant magnitude and phase plots, (iii) Replace the resistive load by appropriate active load and observe parameters as mentioned in (i) and (ii). Note: Active loads may be current source, diode-connected and/or push-pull types
- Construct an active load differential amplifier by setting the bias point mentioned in Expt. No.1. Based on this, (i)Determine its common-mode gain and differential gain and compute its CMRR and (ii) Observe its linearity and analyze its performance trade-off.
- Simulation of a PN junction diode to (i) obtain its structure, (ii) obtain diode characteristics, (iii) view contour plots and (iv) extract key device parameters through cutline analysis.
- Simulation of a BJT to (i) generate the device structure, (ii) study collector current characteristics, (iii) view contour plots and (iv) extract key device parameters through cutline analysis.
- Simulation of a MOSFET to (i) generate the structure, (ii) analyze drain current for varying drain voltages, (iii) view contour plots and (iv) extract key device parameters through cutline analysis.
- Simulation of an SOI MOSFET to (i) simulate the device structure, (ii) examine transfer characteristics, (iii) view contour plots, (iv) extract parameters of short channel effects like Vth, DIBL, Subthreshold slope, ION, IOFF, and ION/ IOFF and (v) extract key device parameters through cutline analysis.
- Simulation of an SOI Junctionless FET to (i) obtain the structure, (ii) evaluate drain current behavior, (iii) view contour plots, (iv) extract parameters of short channel effects like Vth, DIBL, Subthreshold slope, ION, IOFF, and ION/ IOFF and (v) extract key device parameters through cutline analysis.
Programs
- M. Tech. in Automotive Engineering -Postgraduate
- Fellowship in Basic Obstetric Ultrasound 6 Months -Fellowship