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Pan-Sharpening of Multi-spectral Remote Sensing Data Using Multi-resolution Analysis

Publication Type : Conference Paper

Publisher : Springer Nature Singapore

Source : Lecture Notes in Electrical Engineering

Url : https://doi.org/10.1007/978-981-99-0085-5_56

Campus : Amritapuri

School : School of Computing

Year : 2023

Abstract : The images from the Earth Observation (EO) sensors can be classified as panchromatic (PAN) and multispectral (MS) based on spectral bands. The MS bands have lower spatial resolution than PAN which makes the fusion of these bands aka pan-sharpening important. Here, different multi-resolution analysis (MRA) techniques are used for pan-sharpening. The results are compared using six different evaluation metrics such as correlation coefficient (CC), standard deviation (SD), peak-signal to noise ratio (PSNR), root mean square error (RMSE), spectral angle mapper (SAM), and erreur relative globale adimensionnelle de synth’ese (ERGAS). Though CC, SD, and RMSE are almost similar for all the methods, Haar has the highest PSNR, and Coiflet has the lowest SAM and ERGAS value.

Cite this Research Publication : Aparna S. Menon, J. Aravinth, S. Veni, Pan-Sharpening of Multi-spectral Remote Sensing Data Using Multi-resolution Analysis, Lecture Notes in Electrical Engineering, Springer Nature Singapore, 2023, https://doi.org/10.1007/978-981-99-0085-5_56

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