Publication Type : Journal Article
Publisher : Institute of Electrical and Electronics Engineers (IEEE)
Source : IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing
Url : https://doi.org/10.1109/jstars.2025.3637223
Campus : Coimbatore
School : School of Engineering
Department : Electrical and Electronics
Year : 2026
Abstract : This study proposes a deep learning model for the integration of Landsat-8 and Sentinel satellite imagery to enhance the spatial, spectral, and temporal resolution of drought forecasting. Landsat-8 offers a superior spatial resolution but lower temporal frequency, whereas Sentinel imagery provides a higher temporal frequency but a reduced spatial resolution. The integration of these datasets mitigates the limitations inherent in each dataset, thereby improving the quality of Earth observation data and creating a more robust dataset for precise monitoring of droughts. Correlation analysis revealed that the fused dataset achieved stronger relationships between VCI and NDWI (r=0.72) and between VCI and SPEI (r=0.65) than the relationships achieved using the Sentinel-2 (r=0.68, r=0.62) and Landsat-8 (r=0.60, r=0.58) datasets. A bi-directional long short-term memory (Bi-LSTM) model was then applied to predict SPEI-12 from the vegetation and hydrological variables. The model achieved an R2 of 0.7946 and an root mean square error (RMSE) of 0.5709, indicating a strong agreement between the predicted and observed drought values. Compared with conventional LSTM and random forest models, the Bi-LSTM showed approximately 9–12% improvement in R2 and a 15–20% reduction in RMSE, demonstrating superior capability in capturing nonlinear vegetation–climate dependencies.
Cite this Research Publication : Aravinth J, Anand R, A Deep Learning Model for Integrating Landsat-8 and Sentinel 2 Satellite Images to Improve the Spatiotemporal Fusion Network for Drought Monitoring, IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing, Institute of Electrical and Electronics Engineers (IEEE), 2026, https://doi.org/10.1109/jstars.2025.3637223