Advanced Metrology and Sensing Systems

Unit 1

Computer Aided Inspection: High precision measurements – interfacing - software metrology - Automated visual inspection in manufacturing, contact and non - contact type inspection methods, Electrical field techniques, radiation techniques, ultrasonic - Atomic Force Microscopes (AFM), Talysurf instruments. Laser Metrology: Laser Interferometer, Alignment Telescope, laser scanners. On-line and in - process measurements - diameter, surface roughness, Micro holes, surface topography measurements, straightness and flatness measurement, speckle measurements.

Unit 2

Coordinate Measuring Machine: CMM Types, Applications - Non-contact CMM using Electro optical sensors for dimensional metrology - Non-contact sensors for surface finish measurements – Measurements / programming with CNC CMM – Performance evaluations – Measurement integration. Machine Vision: Image Acquisition and Processing - Binary and gray level images, image segmentation and labelling, representation and interpretation of colours.

Unit 3

Edge detection techniques, Normalization, Grey scale correlation – Reflectance map concepts; surface roughness and texture characterization - photogrammetry. Application of Machine Vision in inspection - Measurement of length, diameters, Surface roughness - automated visual inspection - 3D and dynamic feature extraction. On-line Quality control: On-line feedback quality control variable characteristics - control with measurement interval, one unit, and multiple units control systems for lot and batch production.