Publication

Publication Type : Conference Proceedings

Publisher : IEEE

Source : 2025 2nd International Conference on Trends in Engineering Systems and Technologies (ICTEST)

Url : https://doi.org/10.1109/ictest64710.2025.11042450

Campus : Bengaluru

School : School of Engineering

Department : Electronics and Communication

Year : 2025

Cite this Research Publication : Akshara A, Gayathri R, Alex Raj S M, Towards Robust Media Integrity: Semi-Supervised Image Forgery Localization with DeepLabv3 and ELA, 2025 2nd International Conference on Trends in Engineering Systems and Technologies (ICTEST), IEEE, 2025, https://doi.org/10.1109/ictest64710.2025.11042450