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Publication Type : Journal Article
Source : International Journal of Computational Research and Development, Vol. 1, No. 2, pp. 22 – 25, November 2016
Keywords : Unidirectional Errors, Transient Faults, Error Detection Coding, Resource Overhead, Performance Overhead, SRAM, Latency & Scalable Error Detection Coding (SEDC)
Campus : Chennai
School : School of Engineering
Department : Computer Science and Engineering
Year : 2016
Abstract : With the advent of VLSI technology, the systems fabricated in deep sub micron technology are more prone to errors like intermittent or transient faults, causing unidirectional errors. Research has been established to provide protection against these transient faults to improve the overall reliability of the system. This paper provides a comprehensive survey of fault detection techniques and describe in brief the promising techniques comes under coding techniques that allow the detection of these errors and their performance evaluation.
Cite this Research Publication : V.Sharmilaraj and S.Natarajan, “Evaluating Transient Errors in Electrical Circuits”, International Journal of Computational Research and Development, Vol. 1, No. 2, pp. 22 – 25, November 2016