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Impact of Stress Effect on Triple Material Gate Step-FinFET with DC and AC Analysis

Publication Type : Journal Article

Publisher : Springer Science and Business Media LLC

Source : Microsystem Technologies

Url : https://doi.org/10.1007/s00542-019-04727-2

Campus : Amritapuri

School : School of Computing

Department : Computer Science and Engineering

Year : 2019

Abstract :

Cite this Research Publication : Rinku Rani Das, Atanu Chowdhury, Apurba Chakraborty, Santanu Maity, Impact of stress effect on triple material gate step-FinFET with DC and AC analysis, Microsystem Technologies, Springer Science and Business Media LLC, 2019, https://doi.org/10.1007/s00542-019-04727-2

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