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Statistics

50+

50+

Patents
20192

20192

Books
12000

12000

Book
Chapters
4219

4219

Journal
Publications /
Scopus Indexed
216

216

Conference
Proceedings
9281

9281

Other
Publications
Publications
Organization Security Framework—A Defensive Mechanism

Authors : Anjali T, Sayooj B Kumar, Krishna Rajeev, Sarang Dileep, Adil Muhammed Ashraf

Publisher :Springer Nature Singapore

Publications
AI-Driven Deep Structured Learning for Cross-Site Scripting Attacks

Authors : Anjali T, S Abhishek, Rahulkrishnan Ravindran, V Shriamrut

Publisher :IEEE

Publications
Towards Accurate Auscultation Sound Classification with Convolutional Neural Network

Authors : Anjali T, S Abhishek, Mahima Chowdary Mannava, AJ Ananthapadmanabhan

Publisher :IEEE

Publications
ESP8266 – based Real-time Auscultation Sound Classification

Authors : Anjali T, S Abhishek, Aj Ananthapadmanabhan, Mahima Chowdary Mannava

Publisher :IEEE

Publications
Novel Approach to Record the Attendance of Students Using Facial Recognition

Authors : Anjali T, RN Kulkarni, B Rohith, Raghuveer Nadagouda, S Veeresh

Publisher :IEEE

Publications
A Contemporary Method of Assessing Water Quality based on the Fusion of Predictive Analytics and Deep Structured Learning

Authors : Anjali T, Rahan Manoj, S Abhishek, Bharath Prathap Nair, Nandakishor Prabhu Ramlal

Publisher :IEEE

Publications
CNN Combined with FC Classifier to Combat Artificial Penta-Digit Text-Based Captcha

Authors : Anjali T, S Abhishek, S Sanjana, Mahima Chowdary Mannava

Publisher :Springer Nature Singapore

Publications
Intelligent and Real-Time Intravenous Drip Level Indication

Authors : Anjali T, VS Krishnapriya, Namita Suresh, SR Srilakshmi, S Abhishek

Publisher :Springer Nature Singapore

Publications
Colour Detection Using HSV and RGB Colour Models

Authors : Anjali T, Akash Harikumar, Amal Vinod, S Aravind, S Abhishek

Publisher :IEEE

Publications
Envision: Assistance System for the Visually Impaired

Authors : Anjali T, Alan Koshy Luke, R Adithya Kumar, VG Uday Krishnan, S Abhishek

Publisher :IEEE

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