Publication Type : Conference Proceedings
Publisher : IEEE
Source : 2022 IEEE Silchar Subsection Conference (SILCON)
Url : https://doi.org/10.1109/silcon55242.2022.10028888
Campus : Bengaluru
School : School of Artificial Intelligence
Year : 2022
Abstract :
Cite this Research Publication : Anjali Patel, Subhankar Jana, Juthika Mahanta, Two new 3D distance measures for IFSs and their applications in pattern classification and pathological diagnosis, 2022 IEEE Silchar Subsection Conference (SILCON), IEEE, 2022, https://doi.org/10.1109/silcon55242.2022.10028888