Publication Type : Journal Article
Publisher : Institute of Electrical and Electronics Engineers (IEEE)
Source : IEEE Transactions on Industry Applications
Url : https://doi.org/10.1109/TIA.2026.3675198
Keywords : Time-frequency analysis;Transformers;Accuracy;Feature extraction;Frequency estimation;Convolutional neural networks;Deep learning;Power quality;Fourier transforms;Transient analysis;Data-efficient Image Transformer;Fourier Syn-chrosqueezing Transform;Power quality disturbances;Swin Transformer;Vision Transformer
Campus : Coimbatore
School : School of Artificial Intelligence
Year : 2026
Abstract :
Power quality disturbances (PQDs) are significant irregularities in electrical power systems that can negatively impact system stability and delicate equipment. To ensure the re liability of the power system, PQDs must be classified accurately and effectively. This work investigates the application of Vision Transformer (ViT) based architectures for classifying PQDs, which are preprocessed into spectral images. The performance of the proposed model is evaluated and compared against the convolutional neural networks (CNNs). The three vision transformer variants considered in this work include the Basic ViT model, the Swin Transformer model, and the Data-Efficient Image Transformer (DeiT). Among these three variants, DeiT employs a knowledge distillation strategy, achieving accuracies of 99.33% and 99.38%, and offers qualitative interpretability through attention maps. Through comparative analysis with CNN architectures, such as EfficientNet and DenseNet, this paper highlights the potential of ViT-based models for PQD classification and proposes future extensions toward real-world validation and improved teacher-student frameworks.
Cite this Research Publication : Sreshtamol K G, Rahul Satheesh, Sunitha Rajan, Hassan Haes Alhelou, Comparative Analysis of Vision Transformer Models in Power Quality Disturbance Classification, IEEE Transactions on Industry Applications, Institute of Electrical and Electronics Engineers (IEEE), 2026, https://doi.org/10.1109/TIA.2026.3675198