Publication Type : Conference Paper
Thematic Areas : Amrita e-Learning Research Lab
Publisher : Proceedings of the 2011 International Conference on Image Processing, Computer Vision, and Pattern Recognition, IPCV 2011
Source : Proceedings of the 2011 International Conference on Image Processing, Computer Vision, and Pattern Recognition, IPCV
ISBN : 9781601321916
Keywords : 3-D measurement, Algorithms, Automatic camera calibration, Background objects, calibration, Camera calibration, Cameras, Checker pattern, Comparative analysis, Computationally efficient, Computer vision, Computer vision system, Computers, Contour trees, Corner detection, Corner point, Direct detection, Forestry, Illumination variation, Lighting systems, Mathematical morphology, Morphological operations, Pattern detection, Practical solutions
Campus : Kochi
School : School of Engineering
Center : E-Learning
Department : E-Learning
Year : 2011
Abstract : Checker Pattern detection in the presence of miscellaneous background objects is a challenging task in computer vision systems. In practical applications, the direct detection of corner points fails due to the illumination variation in the lighting system. A computationally efficient checker pattern detection method using morphological operations and contour tree validation is proposed. The proposed method is tolerant to illumination, rotation and scaling variation. Comparative analysis with corner detection demonstrates the viability of the proposed algorithm as a valuable tool for automatic camera calibration and 3D measurements
Cite this Research Publication : A. S. Narayanan and Kamal Bijlani, “A Practical Solution to Checker Pattern Detection based on Contour Validation”, in Proceedings of the 2011 International Conference on Image Processing, Computer Vision, and Pattern Recognition, IPCV 2011, Las Vegas, NV, 2011, vol. 2, pp. 983-987.