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Enhanced Sensitivity of Microwave Inspection of Thin Composites at Resonance

Publication Type : Conference Paper

Publisher : URSI-Asia pacific radio science conference

Source : URSI-Asia pacific radio science conference (APRSC 2019), 09-15 March, 2019, New Delhi, India.

Url : https://ieeexplore.ieee.org/document/8738582

Campus : Chennai

School : School of Engineering

Center : Amrita Innovation & Research

Department : Electronics and Communication

Verified : Yes

Year : 2019

Abstract : In this paper, the resonance behavior of layered dielectric media is exploited for microwave non-destructive testing (NDT) of thin composite. Ultra wide band excitation over 1-20 GHz coupled to the composite using open ended coaxial probe was used to identify sample resonance in the absence of the defect. The time gated reflection coefficient (S11) of the sample measured at resonance was used to record the spatial variation in S11 for an insert with low dielectric contrast embedded in the thin composite. The proposed technique was validated using 3.5 mm thick glass fiber epoxy composite of 6 layers for 10 mm × 10 mm × 0.4 mm inclusion with low dielectric contrast (|Δε r | ≤ 2) in between the composite layers. The measurements indicate enhanced sensitivity for the low dielectric contrast at sample resonance which is lost when inspected off resonance in agreement with the simulations.

Cite this Research Publication : Jayaram Kizhekke Pakkathillam, Balamurugan T Sivaprakasam, C V Krishnamurthy and Kavitha Arunachalam, Enhanced Sensitivity of Microwave Inspection of Thin Composites at Resonance, URSI-Asia pacific radio science conference (APRSC 2019), 09-15 March, 2019, New Delhi, India.

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