Publication Type : Conference Paper
Publisher : Gate Insulator, 2003. IWGI 2003. Extended Abstracts of International Workshop
Source : Gate Insulator, 2003. IWGI 2003. Extended Abstracts of International Workshop on, 2003.
Campus : Amritapuri
School : School of Engineering
Department : Electronics and Communication
Year : 2003
Abstract :
Cite this Research Publication :
M. I. Gardner, Dr. Sundararaman Gopalan, Gutt, J., Peterson, J., Li, H. - J., and Huff, H. R., “EOT scaling and device issues for high-k gate dielectrics”, in Gate Insulator, 2003. IWGI 2003. Extended Abstracts of International Workshop on, 2003.