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LFSR Based Secured Scan design Testability Techniques

Publication Type : Conference Paper

Publisher : Procedia Computer Science

Source : Procedia Computer Science, Elsevier B.V., Volume 115, p.174-181 (2017)

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Keywords : Back doors, Design for testability, LFSR, Linear feedback shift registers, Personal computing, Power overhead, Scan chain, Scan designs, Sensitive informations, Shift registers, Side channel attack, Testability

Campus : Coimbatore

School : Department of Electronics and Communication Engineering

Department : Electronics and Communication

Year : 2017

Abstract : Security and testability are the most important factors affecting designing for testability. Scan chain based testing is a standard DfT (Design for Testability) due to its simple design and low cost. But this method can act as back door, through which the hacker can retrieve the sensitive information through side channel attack. Therefore we developed an efficient and inexpensive LFSR (linear feedback shift register) based secured architecture through which it provides predominant security without effecting testability. The experimental result leads to a low area and power overhead with a secure methodology. © 2017 The Author(s).

Cite this Research Publication : M. I. Shiny and M. Devi, N., “LFSR Based Secured Scan design Testability Techniques”, in Procedia Computer Science, 2017, vol. 115, pp. 174-181.

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