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Computer vision-based learning for event modelling in digital twins

Publication Type : Conference Proceedings

Publisher : Institution of Engineering and Technology (IET)

Source : IET Conference Proceedings

Url : https://doi.org/10.1049/icp.2025.3671

Campus : Chennai

School : School of Engineering

Department : Mechanical Engineering

Year : 2025

Abstract : This study explores the integration of computer vision (CV) techniques for machine learning development of digital twins for manufacturing applications. Digital twins represent a transformative approach to process monitoring and optimization in a field prone to uncertainties and operational inefficiencies. However, existing implementations using sensors for event modelling often encounter limitations in scalability and compatibility, especially with legacy machines, and in monitoring non-machine events such as maintenance events. The research aims to use computer vision as a tool to overcome these challenges. The proposed approach employs computer vision-based learning models to capture and analyse real-time data from physical processes; both machine and non-machine events, addressing the constraints of traditional digital twin systems and providing a more comprehensive and non-invasive monitoring. This approach enhances the adaptability and utility of digital twins, making them low-cost, more scalable, accurate, and responsive to user needs in complex manufacturing environments.

Cite this Research Publication : Purushothaman Venkatakrishnan, Vibhor Pandhare, Rishi Kumar, Bhupesh K. Lad, Computer vision-based learning for event modelling in digital twins, IET Conference Proceedings, Institution of Engineering and Technology (IET), 2025, https://doi.org/10.1049/icp.2025.3671

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