Unit 1

Computer Aided Inspection: High precision measurements – interfacing – software metrology – Automated visual inspection in manufacturing, contact and non – contact type inspection methods, Electrical field techniques, radiation techniques, ultrasonic – Atomic Force Microscopes (AFM), Talysurf instruments. Laser Metrology: Laser Interferometer, Alignment Telescope, laser scanners. On-line and in – process measurements – diameter, surface roughness, Micro holes, surface topography measurements, straightness and flatness measurement, speckle measurements.

Unit 2

Coordinate Measuring Machine: CMM Types, Applications – Non-contact CMM using Electro optical sensors for dimensional metrology – Non-contact sensors for surface finish measurements – Measurements / programming with CNC CMM – Performance evaluations – Measurement integration. Machine Vision: Image Acquisition and Processing – Binary and gray level images, image segmentation and labelling, representation and interpretation of colours.

Unit 3

• Marshall A. D. and Martin R. R. – ‘Computer Vision, Models and Inspection’ – World Scientific – 1998
• Nello Zuech – ‘Understanding and Applying Machine Vision’ – Marcel Dekker – 2000 – 2^nd Edition
• John A. Bosch, Giddings, and Lewis Dayton – ‘Coordinate Measuring Machines and Systems’ – Marcel Dekker – 1999
• ASTE – ‘Handbook on Industrial Metrology’ – Prentice Hall – 1992