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Publication Type : Conference Paper
Publisher : 1st International Conference on Opto-Electronics and Photonic Materials
Source : 1st International Conference on Opto-Electronics and Photonic Materials (ICOPMA-2015), Tamilnadu, India.
Campus : Chennai
School : School of Engineering
Center : Electronics Communication and Instrumentation Forum (ECIF)
Department : Electronics and Communication
Verified : Yes
Year : 2015
Abstract : Here, we propose a different approach for growing strain-coupled In0.5Ga0.5As quantum dot infrared photodetectors (QDIPs) with varying dot layer periodicity. Strain calculation is done throughout the quantum dot (QD) heterostructures, which has a significant effect on the carrier probability density functions. The localization of the electron probability density function in each heterostructure has a strong correlation with the photoresponse. The confined electron wavefunction in the top QD layer of the optimized device heterostructure (trilayer QDIP having dot layer periodicity of three) would be useful for hyperspectral imaging applications owing to its narrow (8.67 meV) photoresponse. Rapid thermal annealing treatment was carried out on the trilayer QDIP to investigate the enhancement in its optoelectronic properties. The dark current density reduced by two orders, and the operating temperature increased by 30 °C for the 650 °C-annealed counterpart. Also, the responsivity enhanced by two times (2.05 A/W at −1 V) for the annealed QDIP.
Cite this Research Publication : V. Damodaran, R. K. Gujral and K. Ghosh, “A theoretical analysis on the performance of annealed InAs/GaAs quantum dot infrared photodetectors”, in 1st International Conference on Opto-Electronics and Photonic Materials (ICOPMA-2015), Tamilnadu, India.