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An Integrated Platform for Lie Detection and Plagiarism analysis in Interviews

Publication Type : Conference Paper

Publisher : IEEE

Source : 2024 IEEE Conference on Engineering Informatics (ICEI)

Url : https://doi.org/10.1109/icei64305.2024.10912205

Campus : Chennai

School : School of Engineering

Year : 2024

Abstract : This paper discusses an advanced interview platform that integrates AI-driven technologies for interview integrity and authenticity. It is possible to record video-based interviews with built-in functionalities including identifying lying, plagiarism analysis, and stress evaluation. Video recording is carried out simultaneously while concurrently recording the audio; transcripts are also generated. The transcripts are consequently passed through the Winston AI plagiarism checker to search for signs of internet usage during the interview. Facial analysis is used to measure stress and detect deception in real-time. The tool generates a comprehensive integrity report and provides an innovative tool to carry out safe and reliable interviews.

Cite this Research Publication : S Snehalakshmi, S A Lakshmanan, B Devanathan, An Integrated Platform for Lie Detection and Plagiarism analysis in Interviews, 2024 IEEE Conference on Engineering Informatics (ICEI), IEEE, 2024, https://doi.org/10.1109/icei64305.2024.10912205

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