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Bayesian sequential estimation of two parameters of a Weibull distribution

Publication Type : Journal Article

Publisher : Microelectronics Reliability

Source : Microelectronics Reliability, Volume 34, Number 3, p.509 - 519 (1994)

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Campus : Coimbatore

School : School of Engineering

Center : Computational Engineering and Networking

Department : Electronics and Communication

Year : 1994

Abstract : Weibull distribution is one of the most widely used model for failure data in reliability studies. In this paper a sequential estimation procedure for estimating the parameters of Weibull distribution is proposed, which is, in principle similar to Kalman filtering. The main advantage of this approach is that it shows the variation of parameters over a time as new failure data becomes available to the analyst for estimation. Also once an available data has been used, the method does not require that data for further processing as and when the new data becomes available for updating the estimates of parameters. Its use in Quality control asa control chart has been indicated and the procedure is illustrated with the help of examples.

Cite this Research Publication : Dr. Soman K. P. and Misra, K. B., “Bayesian sequential estimation of two parameters of a Weibull distribution”, Microelectronics Reliability, vol. 34, pp. 509 - 519, 1994.

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