Research Outcome

Authors : Prof. Raghu Raman, Adil S. Al-Busaidi, Raghu Raman, Laurie Hughes, Mousa Ahmed Albashrawi, Tegwen Malik, Yogesh K. Dwivedi, Thuraiya Al- Alawi, Mohammed AlRizeiqi, Gareth Davies, Mark Fenwick, Parul Gupta, Shashikala Gurpur, Apeksha Hooda, Paulius Jurcys, Daryl Lim, Nicola Lucchi, Tanvi Misra, Ramakrishnan Raman, Anuragini Shirish, Paul Walton

Publisher :Elsevier BV

Authors : Prof. Raghu Raman, Krishnashree Achuthan, Sasangan Ramanathan, Raghu Raman

Publisher :Institute of Electrical and Electronics Engineers (IEEE)

Authors : Sudha Yadav, Snehith Reddy Jambula, Sri Chaithanya Mathi, Sai Nadh Polu, Kenny Gee Oberoi JM, Vedha Pranava Mateti, Sudha Yadav

Publisher :IEEE

Authors : Sudha Yadav, Snehith Reddy Jambula, Sri Chaithanya Mathi, Sai Nadh Polu, Sudha Yadav

Publisher :IEEE

Authors : Sudha Yadav, Palanki Amitasree, Sudha Yadav

Publisher :IEEE

Authors : Sudha Yadav, Jambula Snehith Reddy, Sri Chaithanya Mathi, Polu Sai Nadh Reddy, Vedha Pranava Mateti

Publisher :IEEE

Authors : Sudha Yadav, Vedha Pranava Mateti, Sri Chaithanya Mathi, Snehith Reddy Jambula, Sudha Yadav

Publisher :IEEE

Authors : Sudha Yadav, Gadi Sree Krishna Sai Siri, Jonnalagadda Vaishnavi, Msr Vaagdevi, Sudha Yadav

Publisher :IEEE

Authors : Sudha Yadav, Sudha Yadav, R Anand

Publisher :IEEE

Authors : Dr. Rashmi M. R., Kenny Gee Oberoi J.M, Myreddy Kumar Durga Trinadh, Tangudu Ram Chaitanya, Lekshmi S., Rashmi M.R., Lee Hoong Pin

Publisher :IEEE

Authors : Dr. Saleeshya P. G., Vivek Gopi

Publisher :Elsevier BV

Authors : Dr. Rashmi M. R., V. Thanuush, Hoong Pin Lee

Publisher :IEEE