Publications

Authors : Dr. Balamurugan S., Chandrakala, KRM, Avineeth Subramaniam K., Kayalvizhi, S

Publisher : PSACO-2008

Authors : K.B. Misra, Dr. Soman K. P

Publisher : Microelectronics Reliability

Authors : Anand Kumar Rajasekharan, T.Ramachandaran, Guhan Srinivasan, Vijayalakshmy Naagaraj, Suhanya Manoharan, Jayesh Krishnakumar

Publisher : Research and Reviews in Electrochemistry

Authors : Dr. K. I. Ramachandran, Adarsh S, Hemasai K

Publisher : International Journal of Pure and Applied Mathematics.

Authors : H. J. Cho, C. S. Kang, K. Onishi, Dr. Sundararaman Gopalan, R. Nieh, R. Choi, E. Dharmarajan, J. C. Lee

Publisher : International Electron Devices Meeting. Technical Digest

Authors : Dr. Soman K. P., Misra, Krishna B

Publisher : Reliability and Safety Analyses under Fuzziness, Physica-Verlag HD, Heidelberg

Authors : Thilagavathy.P, Saratha.R

Publisher : JADU

Authors : Balamurugan, S., Chandrakala, KRM, Sankaranarayanan, K.

Publisher : College of Engineering, Trivandrum

Authors : Jayaraj Poroor, B. Jayaraman

Publisher : IEEE

Authors : Anand Selvin, S., Bharathi Ravi, K., G. S. Darwino, Harishankar, R., Jitha, R., Dr. Jayakumar M.

Publisher : Technical Report of ECE, Electron, Special Issue, Proceedings of National Conference on Recent Trends in Communications and Signal Processing

Authors : Sethupathy P., Kaushik Ramana R, Saroj Harikrishn Gopi, Dr. Balajee Ramakrishnananda, Rajesh Senthil Kumar T.

Publisher : International Conference on Applied Mechanics and Optimisation Published as AIP Conference Proceedings

Authors : S. Ravikumar; , Dr. K. I. Ramachandran

Publisher : Materials Today: Proceedings.