Back close
Publications
Generating Synthetic Dataset for Cotton Leaf using DCGAN

Authors : Lakkshmi Yogesh N A, Bharathraj G, Sanjay Prasanth A S, Shreyas S, Rajesh C B

Publisher : IEEE

Publications
Inflight Rerouting for an Unmanned Aerial Vehicle

Authors : Amit Agarwal, Meng-Hiot Lim, Maung Ye Win Kyaw, Meng-Joo Er

Publisher : GECCO (2)

Publications
Solution to the Fixed Airbase Problem for Autonomous URAV Site Visitation Sequencing

Authors : Amit Agarwal, Yew Kong Leong, Meng-Hiot Lim, Chan Yee Chew, Tong Kiang Poo, Meng-Joo Er

Publisher : GECCO (2)

Publications
ACO for a new TSP in Region Coverage

Authors : Meng-Hiot Lim, Chan Yee Chew, Meng-Joo Er, Dr. Amit Agarwal

Publisher : 2005 IEEE/RSJ International Conference on Intelligent Robots and Systems

Publications
Proportional Partition of Holed Rectilinear Region amongst Multiple URAVs

Authors : Amit Agarwal, Meng-Joo, Meng-Hiot Lim

Publisher : Proceedings of the 2005 IEEE International Conference on Robotics and Automation

Publications
Algorithms for Derivation of Structurally Stable Hamiltonian Signed Graphs

Authors : Frank Harary, , Donald C. Wunsch, Meng-Hiot Lim, Dr. Amit Agarwal

Publications
A New Machine Learning Paradigm for Terrain Reconstruction

Authors : C.-W.T. Yeu, Yew-Soon Ong, Meng-Hiot Lim, Guang-Bin Huang, Amit Agarwal

Publisher : IEEE Geoscience Remote Sensing Letters

Publications
Rectilinear Workspace Partitioning for Parallel Coverage using Multiple UAVs

Authors : Amit Agarwal, Nghia Nguyen, Meng-Joo Er, Meng-Hiot Lim

Publisher : Journal of Advanced Robotics

Publications
Hybrid Ant Colony Algorithms for Path Planning in Sparse Graphs

Authors : Kwee Kim Lim, Amit Agarwal, Yew-Soon Ong, Meng-Hiot Lim, Xianshun Chen

Publisher : Journal of Soft Computing

Publications
Molecular Modeling of Signal Peptide Recognition by Eukaryotic Sec Complexes

Authors : Sreetama Das, Pratiti Bhadra, S. Ramakumar, Debnath Pal

Publications
Transfer risk under Basel Pillar 1

Authors : Amit Agarwal, Peter Thompson, Paul Harrald, Yin Yee Kan

Publisher : Journal of Credit Risk

Admissions Apply Now