Course

Unit 1

Error and data analysis:Review of error analysis estimate confidence intervals statistical inferences linear and non linear regression analysis including analysis of fits (?2 test), correlation analysis (R2)

Unit 2

Review of Fourier Transforms:Time domain and frequency domain spectra, Implementing Fast Fourier Transforms.

Unit 3

Xray diffraction and detectorsProduction of X-rays, Scattering from an electron, atom and unit cell (calculation of structure factors), Powder X-ray diffraction and determination of crystal structures from diffraction data, particle and photon detectors: GM counter, Scintillation detector, Proportional counter

Unit 4

MicroscopyScanning electron microscopy and transmission electron microscopy Discussion of electron sources, Secondary and Back scattered electrons, analytical electron microscopy, electron diffraction, amplitude and phase contrast microscopy.

Unit 5

SpectroscopyReview of IR, EPR and NMR spectral lines including selection rules, calculation of g-factor, instrumentation for IR, EPR and NMR

Text Books / References

Text Books:

For Error analysis (Unit I):

1. Bevington and Robinson, Data Reduction and Error Analysis for the physical sciences, 3″ , McGraw-Hill Education, 2002.
2. R Taylor, An introduction to error analysis: The study of uncertainties in physical measurements, 2‘^d Ed., University Science Books, 1997.

For Fourier Transforms (Unit II):

1. Erwin Kreyszig, Advanced Engineering Mathematics, l0“¹ , Wiley, 2015.
2. F James, A students guide to Fourier Transforms, 3′^d Ed., Cambridge University Press, 2012.

For X-ray diffraction and detection (Unit III):

1. S S Kapoor and V S Ramamoorthy, Nuclear Radiation detectors, New Age International,
2. RamakanthHebbar, Basics of X-ray diffraction and its applications, 1“ , I. K. International Publishing House, 2011.
3. B E Warren, X-ray diffraction, New edition , Dover Publications Inc. 1990.

For Microscopy (Unit IV):

1. Ray F Egerton, Physical Principles of Electron Microscopy: An introduction to SEM, TEM and AEM, Springer, 2005.

For Spectroscopy (Unit V):

1. Colin Banwell, Elaine Mccash, Fundamentals of Molecular spectroscopy, McGraw Hill Education, 4′^h, 1994.
2. “Instrumental methods of analysis” by Williams, Merrit, Dean and Settle (Chemistry section of our library)

Reference Books:

1. Schaums Series on Probability and Statistics
2. “Elements of X-ray diffraction”, D. Cullity
3. “Transmission electron microscopy” by Williams and Carter
4. “X-ray diffraction : In crystals, Imperfect crystals and amorphous bodies” by A Guiner
5. “X-ray diffraction” by West

Course Outcomes:

• COl Understand the existing idea of probability to analyze continuous distribution functions
• CO2 Apply error analysis and quantification of error propagation in linear/non-linear systems
• CO3 Understand and apply Fourier transforms and their relevance in extracting signals from time domain and displaying in frequency domain
• CO4 Understand the principles of diffraction, and various types of spectroscopy.
• CO5 Interpret l D X-ray diffraction data, understand imaging modes in microscopes and interpretation of signals from various spectroscopic instruments