Year : 2024
Digital Simulation of ZnON-TFT
Cite this Research Publication : Anjana J. G., Malavika M. U., Digital Simulation of ZnON-TFT, 2024 9th International Conference on Communication and Electronics Systems (ICCES), IEEE, 2024, https://doi.org/10.1109/icces63552.2024.10859692
Publisher : IEEE
Year : 2023
Comparative Study of Thin Film Transistor Configurations Using TCAD
Cite this Research Publication : J G Anjana, Anantha Krishna J Nair, G Govind, Sangeeth Johnson, Adarsh M Nair, Comparative Study of Thin Film Transistor Configurations Using TCAD, 2023 7th International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech), IEEE, 2023, https://doi.org/10.1109/iementech60402.2023.10423533
Publisher : IEEE
Year : 2022
A Photo Conductivity simulation of ZnON TFT using ATLAS TCAD
Cite this Research Publication : Anjana, J.G., Nair, A.R. and Anand, V., 2022, August. A Photo Conductivity simulation of ZnON TFT using ATLAS TCAD. In 2022 Third International Conference on Intelligent Computing Instrumentation and Control Technologies (ICICICT) (pp. 1060-1064). IEEE
Publisher : IEEE
Year : 2022
A Study on Deposition Rate and Thickness for ZnON Thin Films
Cite this Research Publication : Anjana, J.G. and Anand, V., 2022, September. A Study on Deposition Rate and Thickness for ZnON Thin Films. In 2022 4th International Conference on Inventive Research in Computing Applications (ICIRCA) (pp. 207-210). IEEE
Publisher : IEEE
Year : 2020
Two dimensional numerical simulation of zinc oxy-nitride thin film transistors
Cite this Research Publication : Anjana, J.G. and Anand, V., 2020, July. Two dimensional numerical simulation of zinc oxy-nitride thin film transistors. In 2020 International Conference on Electronics and Sustainable Communication Systems (ICESC) (pp. 1052-1055). IEEE.
Publisher : IEEE
Year : 2014
A three level cache structure
Cite this Research Publication : Anjana, J.G. and Prasanth, M., 2014, May. A three level cache structure. In 2014 IEEE International Conference on Advanced Communications, Control and Computing Technologies (pp. 426-430). IEEE
Publisher : IEEE