Publication

Publication Type : Journal Article

Publisher : Springer Science and Business Media LLC

Source : Silicon

Url : https://doi.org/10.1007/s12633-022-01669-9

Campus : Amritapuri

School : School of Computing

Department : Computer Science and Engineering

Year : 2022

Cite this Research Publication : Rinku Rani Das, Santanu Maity, Atanu Chowdhury, Apurba Chakraborty, Suman Kumar Mitra, Effect of Positive/Negative Interface Trap Charges on the Performance of Multi Fin FinFET (M-FinFET), Silicon, Springer Science and Business Media LLC, 2022, https://doi.org/10.1007/s12633-022-01669-9