Publication

Abstract : Long-term reliability in deep-submicron technologies is increasingly compromised by aging mechanisms like NBTI, HCI, and EM, which degrade circuit timing and elevate the risk of delay-sensitive faults. Conventional logic built-in self-test (LBIST), designed for manufacturing-time defects, employs static schedules ill-suited for these evolving, in-field fault dynamics. To address this gap, this paper proposes a concept for an adaptive LBIST framework. By integrating lightweight on-chip aging monitors with a risk-driven scheduling policy, the architecture dynamically prioritizes aging-prone regions and adjusts test patterns and intervals based on real-time degradation. This adaptive approach promises to sustain high fault coverage throughout a product's lifetime with minimal overhead, significantly enhancing in-field reliability for mission-critical VLSI systems.