Publication Type : Journal Article
Publisher : Microelectronics Reliability
Source : Microelectronics Reliability, Volume 32, Number 4, p.469 - 473 (1992)
Url : http://www.sciencedirect.com/science/article/pii/002627149290474Y
Campus : Coimbatore
School : School of Engineering
Center : Computational Engineering and Networking
Department : Electronics and Communication
Year : 1992
Abstract : Moments of order statistics have widespread use in life-testing and reliability studies. The orthogonal inverse expansion method is a unique method which allows one to obtain moments and product moments of order statistics of any distribution. In the present paper, we demonstrate the application of the orthogonal inverse expansion method to compute moments of order statistics and the use of these moments in various reliability studies.
Cite this Research Publication : Dr. Soman K. P. and Misra, K. B., “Moments of order statistics using the orthogonal inverse expansion method and its application in reliability”, Microelectronics Reliability, vol. 32, pp. 469 - 473, 1992.