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Course Detail

Course Name Principles of VLSI Testing
Course Code 15ECE369
Program B. Tech. in Electronics and Communication Engineering
Year Taught 2019


Unit 1

Introduction – Need for testing – Role of testing – Elementary testing concepts – Fault and fault model – Defects – Errors and faults – Glossary of fault models – Single stuck-at fault – Fault equivalence – Equivalence of single stuck-at faults – Fault collapsing – Fault dominance – Checkpoint theorem.

Unit 2

Logic and fault simulation – Modeling circuits for simulation – Algorithms for true value simulation and fault simulation – Binary Decision Diagrams – Introduction and construction – Reduction rules and algorithms – ROBDDs – Operation on BDDs and its algorithms – Representation of digital circuits.

Unit 3

Combinational circuit test generation – Algebraic algorithms – Boolean difference method – Fault-table method – Path sensitizing method – ENF method – Structural algorithms – D-Algorithm – PODEM – Advanced algorithms – Fault detection – Two level circuit fault detection – Multilevel circuit fault detection. Sequential circuit test generation: Time frame expansion.

Text Books

  1. Vishwani D. Agrawal and Michael L. Bushnell, “Essentials of Electronic Testing for Digital Memory and Mixed Signal VLSI Circuit,” Springer, 2000.


  1. Samuel. C.Lee, “Digital Circuits and Logic Design,” Prentice Hall India Ltd., 2000.
  2. Parag K. Lala, “An Introduction to Logic Circuit Testing,” Morgan Claypool Publishers, 2009.
  3. Parag K. Lala, “Digital Circuit Testing and Testability,” Academic Press, 1997.

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