Publication Type : Journal Article
Publisher : Elsevier BV
Source : Journal of Physics and Chemistry of Solids
Url : https://doi.org/10.1016/j.jpcs.2023.111854
Keywords : Thermoelectric, Half-Heusler (HH), Valence electron count (VEC), Power factor, Lattice thermal conductivity, Anharmonicity, The n-type semiconductor
Campus : Amaravati
School : School of Engineering
Department : Electronics and Communication
Year : 2024
Abstract : In the current study, the novel pristine compounds of both VEC 18 (NiVAl & NiAlSb) and VEC 19 (NiVSn) materials have been synthesized employing arc-melting and hot-pressed at 1073 K. The measured carrier concentration for all the compounds was found ∿ 1020-1021 cm−3. Further, NiAlSb, NiVAl, and NiVSn half-Heusler (HH) compounds exhibited n-type semiconductor behaviour, with maximum Seebeck coefficients (S) of −50.2 μV/K, −40.5 μV/K, and −14.5 μV/K at 723 K. As a result of the measured S and electrical conductivity, the estimated power factor for NiVSn (0.20 mWm−1K−2), NiAlSb (0.41 mWm−1K−2), and NiVAl (0.65 mWm−1K−2) at 723 K. The NiVSn lattice thermal conductivity (
 κ
 
 l) was reduced to ∿ 79.80 % and 76.71 % as compared to NiAlSb and NiVAl compounds. Despite having reduced 
 κ
 
 l, low zT exhibited for NiVSn compound mainly due to nominal S. The reduced 
 κ
 
 l was mainly attributed to weak chemical bonding results from lower group velocity of phonon, leading to a higher anharmonicity effect in the lattice. Therefore, NiVSn of VEC 19-based compound can be considered as a potential candidate material for TE applications other than traditional 18-VEC HH compounds. The thermoelectric performance of the novel HH compounds is suitably corroborated with the structural and microstructural investigations.
Cite this Research Publication : Abhigyan Ojha, Rama Krushna Sabat, Sivaiah Bathula, Low lattice thermal conductivity of novel NiVSn with 19 valence electron count contrasted to 18 of NiVAl and NiAlSb Half-Heusler compounds, Journal of Physics and Chemistry of Solids, Elsevier BV, 2024, https://doi.org/10.1016/j.jpcs.2023.111854