Programs
- M. Tech. in Automotive Engineering -Postgraduate
- Building Disaster Resilience and Social Responsibility through Experiential Learning: Integrating AI, GIS, and Remote Sensing -Certificate
Authors : Dr. Paramasivam C., S Mahendran
Publisher :Proceedings on National conference on Advanced Communication and Computing
Authors : Dr. R. G. Priyadarshini
Publisher :SAGE Publications
Authors : Mohankumar N.
Publisher :3rd International Conference on Intelligent Systems Network (IISN-2009)
Authors : Sajith Vezhapparambu, R. Mahmood, Pielke, R. A., Sr., K. G. Hubbard, Niyogi, D., Bonan, G., Lawrence, P., Baker, B., McNider, R., Etter, A., Gameda, S., Qian, B., Carleton, A., Beltran-Przekurat, A., Chase, T., Quintanar, A. I., Adegoke, J. O., Sajith Vezhapparambu, Conner, G., Asefi, S., Sertel, E., Legates, D. R., Wu, Y., Hale, R., Frauenfeld, O. W., Watts, A., Shepherd, M., Mitra, C., Anantharaj, V. G., ,, Lund, R., Nordfelt, A., Blanken, P., Du, J., Chang, H. - I., Leeper, R., Nair, U. S., Dobler, S., Deo, R., and Syktus, J
Publisher :Bull. Amer. Meteor. Soc,
Authors : Dr. P. Kanakasabapathy, K Swarup
Publisher :National Conference on Technological Advances and Computational techniques in Electrical Engineering (TACT 2009)
Authors : Dr. P. Kanakasabapathy, Swarup, K Shanti
Publisher :MIT, Manipal
Authors : Dr. Gireesh Kumar T., Alexander, A., Varghese, J., and Johnson, S.
Publisher :Indo-US Conference and Workshop on Cyber Security, Cyber Crime and Cyber Forensics
Authors : Dr. B. Uma Maheswari, B. Arumugam, S., and Rajamani, D. Kumar
Publisher :Recent Trends in Information Communication Technology conference
Authors : Dr. Sriram Sankaran, Mohammad Iftekhar Husain; Ramalingam Sridhar
Publisher :Proceedings of Annual Symposium on Information Assurance (ASIA)
Authors : Dr. Sanjay Pal, Mikhailova M; Xu X; Chen Z; Steffensen B
Publisher :The 27th Annual Dental Science Symposium
Authors : Dr. Balasubramanian A.
Publisher :Manonmaniam Sundarnar University
Authors : Dr. S. Aramvalarthan, Jose Kalayil
Publisher :HRM Review