Back close

Statistics

50+

50+

Patents
20192

20192

Books
12000

12000

Book
Chapters
4219

4219

Journal
Publications /
Scopus Indexed
216

216

Conference
Proceedings
9281

9281

Other
Publications
Publications
MIMO-OFDM based cognitive radio for modulation recognition

Authors : Deepa, R.a; Baskaran, K.b

Publisher :Communications in Computer and Information Science

Publications
Middle Level Managers: Competency and Effectiveness.

Authors : Dr. Murale Venugopalan, Preetha, R

Publisher :SCMS Journal of Indian Management

Publications
Microstructural refinement and mechanical properties of direct extruded ŻM21 magnesium alloys

Authors : Dr. Thirugnasambandam G. Manivasagam, Thirugnasambandam G. Manivasagam; S. KUMARAN; T. SRINIVASA RAO

Publisher :Transactions of Nonferrous Metals Society of China

Publications
Microfibrillar Composites from Polymer Blends

Authors : Dr. Jayanarayanan K., Sabu Thomas, and Kuruvilla Joseph

Publisher :Mahatma Gandhi University

Publications
Microbiological diagnosis of pulmonary tuberculosis in children: Comparative study of induced sputum and gastric lavage

Authors : Qureshi, U.A.a; Gupta, A.K.b; Mahajan, B.c; Qurieshi, M.A.d; Altaf, U.e; Parihar, R.b; Bhau, K.S.f

Publisher :Indian Journal of Pediatrics

Publications
Microbial keratitis in Gujarat, Western India: findings from 200 cases.

Authors : Dr. V. Anil Kumar, Snehal Pandya, Ghanshyam Kavathia, Sejul Antala, Molly Madan, and Tanuja Javdekar

Publisher :The Pan African medical journal

Publications
THE METHOD, MANNER, PROCESS AND SYSTEM OF PREPARATION OF SUPER CAPACITOR ELECTRODES USING NANOSCALE ACTIVATED CARBON FROM GRAPHITE BY BALL MILLING

Authors : Prof. Shantikumar Nair, Dr. K R V Subramanian ; Dr. Avinash Balakrishnan ; Nandini RanganathaN ; Mini P A

Publisher :U.S. Patent

Publications
A method for calculation of optimum data size and bin size of histogram features in fault diagnosis of mono-block centrifugal pump

Authors : Dr. Sakthivel N. R., Va Indira, Vasanthakumari, Rb, and Sugumaran, Vd

Publisher :Expert Systems with Applications

Admissions Apply Now