Publisher :IEEE
Authors : Aiswarya, S, Meenu, L, Nair, S. B, Menon, S. K
Publisher :IEEE
Publisher :Wiley Subscription Services, Inc., A Wiley Company
Authors : Dr. SP. Chokkalingam, N.V. Anudeep, K. Stewart Kirubakaran,
Publisher :Test Engineering & Management
Authors : Mathiyazhagan, Sakthi Nagaraj, T, Jeyapaul, R, Vimal, K.
Publisher :Taylor and Francis Online
Authors : Mathiyazhagan, K, Sakthi Nagaraj, T, Jeyapaul, R
Publisher :Science Direct
Authors : Siji Rani S., Nayana Ramakrishnan, Meenakshi Nair J., Deepak Jayaprakash, H. Ananthakrishnan
Publisher :IEEE